4. Optics: measuring and testing
  5. Inspection of flaws or impurities

John D. Sylvestri

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Angular spectrum tailoring in solid immersion microscopy for...

Optics: measuring and testing – Inspection of flaws or impurities
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Angular spectrum tailoring in solid immersion microscopy for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Apparatus and method for single die backside probing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Backside unlayering of MOSFET devices for electrical and...

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
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Barrier dielectric stack for seam protection

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Profile ID: LFUS-PAI-P-2263229

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