4. Optics: measuring and testing
  5. Standard

Jiri Pecen

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Apparatus for calibrating a surface scanner

Optics: measuring and testing – Standard
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for in-situ end-point detection and optimiz

Abrading – Abrading process – Glass or stone abrading
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for in-situ end-point detection and...

Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for in-situ monitoring of thickness during

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for in-situ monitoring of thickness using a

Optics: measuring and testing – With plural diverse test or art
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Jiri Pecen does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Jiri Pecen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jiri Pecen will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-86045

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure