4. Thermal measuring and testing
  5. Housing, support, or adjunct

Jianou Shi

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Contact temperature probe with unrestrained orientation

Thermal measuring and testing – Housing – support – or adjunct
Patent

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Contactless charge measurement of product wafers and control...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Corona based charge voltage measurement

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Corona based charge voltage measurement

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Corona based charge voltage measurement

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-603835

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