4. Single-crystal, oriented-crystal, and epitaxy growth processes;
  5. Forming from vapor or gaseous state
  6. With decomposition of a precursor

Ji-Ping Li

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Evaluating a multi-layered structure for voids

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Evaluating a multi-layered structure for voids

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Evaluating a multi-layered structure for voids

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Evaluating a multi-layered structure for voids

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Identifying defects in a conductive structure of a wafer,...

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
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