4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Jerry D. Hayes

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Array-based early threshold voltage recovery...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Characterization circuit for fast determination of device...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Circuit and method for modeling I/O

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Delay-based bias temperature instability recovery...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Method and apparatus for performing input/output floor...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
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Profile ID: LFUS-PAI-P-2180212

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