Jeong Hwan Bae

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Circuit and method for testing frequencies

Excavating
Patent

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Conversion characteristic test circuit for analog/digital conver

Coded data generation or conversion – Converter calibration or testing
Patent

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Input/output device with self-test capability in an integrated c

Patent

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Rambus ASIC having high speed testing function and testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-446588

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