Circuit and method for testing frequencies

Excavating

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Details

371 70, 324 7641, 324 7648, G01R 2300, H03D 1300

Patent

active

056639708

ABSTRACT:
A method and apparatus are provided for testing whether an electronic circuit, or DUT, for generating a clock signal is generating a signal of a frequency within a regulated frequency range. The method includes the steps of: supplying a driving clock or signal to cause the circuit to be tested to generate test clock signals as designed; causing a clock generator to generate an upper limit frequency clock signal and a lower limit frequency clock signal based on the clock signal of the circuit; simultaneously counting the testing clock signal of the circuit, the upper limit frequency clock signal and the lower limit frequency clock signal of the clock generator, and generating resultant signals upon the count reaching certain numbers; and issuing a pass signal when a count result of the upper limit frequency clock signals is output first, and a count result of the testing clock signal of the circuit is output next, and otherwise issuing a fail signal.

REFERENCES:
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patent: 5199008 (1993-03-01), Lockhart et al.
patent: 5245311 (1993-09-01), Honma
patent: 5442278 (1995-08-01), Fan Chiang et al.
patent: 5475324 (1995-12-01), Tomiyori
patent: 5479420 (1995-12-01), Hong et al.
patent: 5488645 (1996-01-01), Mori et al.

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