Conversion characteristic test circuit for analog/digital conver

Details Conversion characteristic test circuit for analog/digital conver Conversion characteristic test circuit for analog/digital conver

1996-01-03

1998-01-27

Gaffin, Jeffrey A.

Coded data generation or conversion

Converter calibration or testing

341155, 324 731, H03M 112

Patent

active

057126330

ABSTRACT:
A conversion characteristic test circuit and method for an A/D converter uses a DNL error, an INL error, and a dynamic conversion characteristic to analyze digital data output from an A/D converter for judging an operation state of the A/D converter. The conversion characteristic test circuit includes a data detecting unit that detects a digital code randomly output from the A/D converter. A test signal generating unit generates a sequential test signal in accordance with a test clock signal. A DNL error data detecting unit receives a data output by the data detecting unit in accordance with the sequential test signal and subtracts the data from an code-by ideal data to compute DNL error data. An INL error data detecting unit computes INL error data based on the DNL error data and the test clock signal. A judging unit receives the outputs of the DNL error data detecting unit and the INL error data detecting unit and detects a DNL error and an INL error to judge an operation state of the A/D converter.

REFERENCES:
patent: 5132685 (1992-07-01), DeWitt et al.
patent: 5185607 (1993-02-01), Lyon et al.
patent: 5305003 (1994-04-01), Han
patent: 5341135 (1994-08-01), Pearce
patent: 5361067 (1994-11-01), Pinckley
patent: 5594612 (1997-01-01), Henrion

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