4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jens Luepke

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Address generator for generating addresses for testing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and device for testing semiconductor memory devices

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Test circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Test circuit for testing a circuit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Test data generator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2621478

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