Method and device for testing semiconductor memory devices

Details Method and device for testing semiconductor memory devices Method and device for testing semiconductor memory devices

2007-10-02

2007-10-02

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S193000

Reexamination Certificate

active

10487255

ABSTRACT:
A test method for a semiconductor memory device having a bidirectional data strobe terminal for a data strobe signal, and having at least one data terminal for a data signal at a test apparatus, which can at least generate data strobe and data signals and also transfer and evaluate data signals. The memory device is connected to a test apparatus, which generates data strobe and data signals, and transfers and evaluates data signals. In the course of the test using the data strobe and data signals, data are transferred from the first semiconductor memory device to a second semiconductor memory device of identical type and are evaluated after a read-out from the second semiconductor memory device by the test apparatus.

REFERENCES:
patent: 6195616 (2001-02-01), Reed et al.
patent: 6339555 (2002-01-01), Hamada et al.
patent: WO 02/39459 (2002-05-01), None
Article by Christof Windeck: Dopplereffekt. In: c't Magazin fur Computertechnik, Heft 23, Nov. 2000, S. 162-166.
German Office Action dated Jul. 26, 2002.

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