Optics: measuring and testing
By polarized light examination
Inventor
active
Application of intermediate wavelength band spectroscopic...
Application of spectroscopic ellipsometry to in situ real...
Application of spectroscopic ellipsometry to in-situ real...
Beam splitting analyzer means in rotating compensator...
Broadband ellipsometer or polarimeter system including at...
No associations
LandOfFree
Jeffrey S. Hale does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Jeffrey S. Hale, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jeffrey S. Hale will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2239160