4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

James N. McNames

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Parametric outlier detection

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
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Pattern component analysis and manipulation

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Pattern detection for integrated circuit substrates

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Statistical decision system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test limits based on position

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2633005

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