4. Metal working
  5. Method of mechanical manufacture
  6. Electrical device making

James F. Wenzel

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Apparatus, method, and wafer used for testing integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for manufacturing a stimulus wafer for use in a wafer-to-

Metal working – Method of mechanical manufacture – Electrical device making
Patent

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Method for probing a semiconductor wafer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method for testing a product integrated circuit wafer using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Multi-chip semiconductor device and method for making the device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Chip mounted on chip
Patent

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Profile ID: LFUS-PAI-P-357572

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