James C. Hwang

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GaAs FETs Having long-term stability

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III-V Based semiconductor devices and a process for fabrication

Metal working – Method of mechanical manufacture – Assembling or joining
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Method of substrate heating for deposition processes

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
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Signal probing of microwave integrated circuit internal nodes

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-921854

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