Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-05-12
2000-04-11
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 104
Patent
active
060492198
ABSTRACT:
A microwave integrated circuit internal-node waveform probing arrangement using a portable ungrounded voltage sensing probe and a commercially available transition analyzer instrument are disclosed. Harmonic frequency and phase processing are accomplished on the probe sensed voltage waveforms from internal nodes of for example a C-band monolithic microwave integrated circuit (MMIC) power amplifier circuit device. The disclosed probing is applied to determining signal voltage and signal current flow waveforms for the MMIC device. Examples relating to use of the invention to analyze operation of microwave circuits and prevent premature device failures are included; these include variation of waveforms as a function of frequency, drive and measurement location in a device. The potential impact of the disclosed technique includes MMIC design verification, in-situ device model extraction, process diagnosis, and reliability assessment.
REFERENCES:
patent: 4980636 (1990-12-01), Romannofsky et al.
patent: 5268636 (1993-12-01), Phillips et al.
C. J. Wei, Y. A. Tkachenko, J. C. M. Hwang, K. R. Smith and A. H. Peak, "Internal-Node Waveform Analysis of MMIC Power Amplifiers", IEEE Trans. Microwave Theory Tech., vol. 43, No. 12, Dec. 1995.
C. J. Wei, Y. A. Tkachenko, J. C. M. Hwang, K. R. Smith and A. H. Peak, "Internal-Node Waveform Probing of MMIC Power Amplifiers", abstract document presented to attendees at IEEE Microwave and Millimeter-Wave Monolithic Circuits Symposium May 14, 1995.
"Fine-Pirch Microprobes", manufacturer's data sheet published by Cascade Microtech Inc., Mar. 1993.
C. J. Wei, Y.A. Tkachenko and J.C.M. Hwang, "Non-Invasive Waveform Probing for Non-Linear Networks Analysis," 1993 IEEE MTT-S Digest , pp. 1347-1350 (month available).
Y.A. Tkachenko, Y. Lan, D.S. Whitefield, C.J. Wei and J.C.M. Hwang et al. "Hot Electron-Induced Degradation of Metal-Semiconductor Field-Effect Transistors," GaAs IC Symposium, 1994 IEEE, pp. 259-262, (month unavailable).
F. Van Raay and G. Kompa, "A New On-Wafer Large-Signal Waveform Measurement System with 40 Ghz Harmonic Bandwidth," 1992 IEEE MTT-S Digest, pp. 1435-1438 (month unavailable).
M. Demmler, P.J. Tasker, M. Schlechtweg, "A Vector Corrected High Power On-Wafer Measurement System with a Frequency Range for the Higher Harmonics up to 40 Ghz", European Microwave Conf. 1994, pp. 1367-1372 (month unavailable).
Calcatera Mark C.
Hwang James C.
Kehias Lois T.
Wei Ce-Jun
Hollins Gerald B.
Kundert Thomas L.
Nguyen Vinh P.
The United States of America as represented by the Secretary of
LandOfFree
Signal probing of microwave integrated circuit internal nodes does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Signal probing of microwave integrated circuit internal nodes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Signal probing of microwave integrated circuit internal nodes will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1179552