4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Hiroshi Motoki

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Electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent

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Method and apparatus for processing pattern image data by SEM

Image analysis – Histogram processing – For setting a threshold
Patent

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Method and apparatus for processing pattern image data by SEM

Image analysis – Histogram processing – For setting a threshold
Patent

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Pattern inspection method, pattern inspection apparatus,...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Pattern observation apparatus, pattern observation method,...

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1347498

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