Pattern inspection method, pattern inspection apparatus,...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

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C250S491100, C250S492100, C250S492200, C250S492300, C250S306000, C250S307000, C250S309000, C250S311000

Reexamination Certificate

active

07732763

ABSTRACT:
A pattern inspection method includes: irradiating a first region of a surface of a sample having a pattern to be inspected with a charged particle beam; acquiring a first two-dimensional image showing a state of the surface of the sample; searching for a pattern similar to a previously prepared reference image within the first two-dimensional image; when the pattern similar to the reference image is not detected in the first two-dimensional image, irradiating a second region of the surface of the sample that has not been irradiated with a charged particle beam; acquiring a second two-dimensional image showing a state of the surface of the sample; and searching a pattern similar to the reference image within the second two-dimensional image.

REFERENCES:
patent: 6952105 (2005-10-01), Cheng et al.
patent: 7375328 (2008-05-01), Yonezawa et al.
patent: 2002/0171051 (2002-11-01), Nakagaki et al.
patent: 2003/0183762 (2003-10-01), Nagaoki et al.
patent: 2005/0199808 (2005-09-01), Obara et al.
patent: 2006/0039596 (2006-02-01), Nojima et al.
patent: 2006/0097158 (2006-05-01), Yamaguchi et al.
patent: 2008/0302963 (2008-12-01), Nakasuji et al.
patent: 2009/0230303 (2009-09-01), Teshima et al.

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