Method and apparatus for processing pattern image data by SEM

Image analysis – Histogram processing – For setting a threshold

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

382170, 382210, 382256, 382270, G06K 900

Patent

active

061119814

ABSTRACT:
Analog image data a SEM are converted into digital data, and are processed by a spatial filtering processing, histogram processing, threshold value setting, three-valued image data processing, noise reduction and the like. Area of a pattern in the three-valued image data is calculated by a labelling and calculation processing, and a pattern is sequentially detected by comparing the area of the pattern with a reference area value. The comparison and detection of the same or similar patterns repeated in the SEM image are performed by using the area of the pattern, and are not performed by a shape of the pattern, thereby resulting a precise detection at high speed by using a microprocessor. Since it is possible to perform a pattern recognition from the area value even though the pattern does not have a characteristic, it is possible to precisely detect and recognize a pattern image in high speed.

REFERENCES:
patent: 4847786 (1989-07-01), Wang et al.
patent: 4975972 (1990-12-01), Bose et al.
patent: 5265200 (1993-11-01), Edgar
patent: 5278921 (1994-01-01), Nakamura et al.
patent: 5345513 (1994-09-01), Takeda et al.
patent: 5438552 (1995-08-01), Audi et al.
patent: 5479535 (1995-12-01), Komatsu

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for processing pattern image data by SEM does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for processing pattern image data by SEM, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for processing pattern image data by SEM will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1257003

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.