4. Chemistry: electrical and wave energy
  5. Apparatus
  6. Coating, forming or etching by sputtering

Hiroshi Matsushita

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Abnormality cause specifying method, abnormality cause...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Adhesive tapes for die bonding

Stock material or miscellaneous articles – Layer or component removable to expose adhesive – Halogen containing compound
Patent

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Beam deflecting method, beam deflector for scanning, ion...

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

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Beam processing apparatus

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate

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Circuit using internal pull-up/pull-down resistor during reset

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-380581

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