Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Reexamination Certificate
2011-07-19
2011-07-19
Kim, Robert (Department: 2881)
Radiant energy
With charged particle beam deflection or focussing
Magnetic lens
C250S492100, C250S492200, C250S397000, C250S398000, C250S492210
Reexamination Certificate
active
07982192
ABSTRACT:
In a beam processing apparatus including a beam scanner having a two electrodes type deflection scanning electrode, the beam scanner further includes shielding suppression electrode assemblies respectively at vicinities of upstream side and downstream side of the two electrodes type deflection scanning electrode and having openings in a rectangular shape for passing a charged particle beam. Each of the shielding suppression electrode assemblies is an assembly electrode comprising one sheet of a suppression electrode and two sheets of shielding ground electrodes interposing the suppression electrode. A total of front side portions and rear side portions of the two electrodes type deflection scanning electrode is shielded by the two sheets of shielding ground electrodes.
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Amano Yoshitaka
Fujii Yoshito
Kabasawa Mitsuaki
Matsushita Hiroshi
Tsukihara Mitsukuni
Arent & Fox LLP
Kim Robert
Logie Michael J
Sen Corporation
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