4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. Specified electrical sensor or system

Hiromi Shimazu

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Mechanical-quantity measuring device

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Semiconductor device and its production process

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Semiconductor device having cobalt silicide film in which...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Semiconductor integrated device and method of fabrication...

Semiconductor device manufacturing: process – Forming schottky junction – Using refractory group metal
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2318480

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