Semiconductor device and its production process

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S757000

Reexamination Certificate

active

06960832

ABSTRACT:
In a semiconductor device having a cobalt silicide film, at least nickel or iron is contained in the cobalt silicide film for preventing the rise of resistance incidental to thinning of the film.

REFERENCES:
patent: 4816421 (1989-03-01), Dynes et al.
patent: 5463254 (1995-10-01), Iyer et al.
patent: 5897348 (1999-04-01), Wu
patent: 5915197 (1999-06-01), Yamanaka et al.
patent: 6235627 (2001-05-01), Nakajima
patent: 6236090 (2001-05-01), Fujisawa
patent: 6294420 (2001-09-01), Tsu
patent: 286062 (1991-01-01), None
patent: 60213058 (1985-10-01), None
patent: 3166735 (1991-07-01), None
patent: 3248562 (1991-11-01), None
patent: 629288 (1994-02-01), None
patent: 7106280 (1995-04-01), None
patent: 9139475 (1997-05-01), None
Mo et al Formation and Properties of Ternary Silicide (CoNi)Si2 Thin Films, IEEE 1998 5th International Conference on Solid State And Integrated Circuit Technology pp 271-274.
Hong et al Magneto-Optic Kerr Effect Measurements on FeCoSi Epitaxially Stabilized on Si (111), Journal of Magnetism and Magnetic Materials, vol. 165 pp 212-215.
http://www.puretechnic.com and http://tosohsmd.com/tsprod.tspcobdt.htm, Material Data Sheet MDS 27.000 which includes the total metallics of the cobalt target, pp 1-4 and 1-3.
Physical Review Letters, vol. 78, No. 16 (Apr. 1997) pp 3133-3136; full text.
Handbook on Thin Filter Manufacturing Method, Japan, Kyoritsu Shuppan KK (Oct. 1994) pp 321-322. “A Metal Silicide”.
Physical Review Letters, vol. 50, No. 6, (Feb. '983), pp 429-432 full t xt.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and its production process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and its production process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and its production process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3485958

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.