Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2005-11-01
2005-11-01
Coleman, W. David (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257S757000
Reexamination Certificate
active
06960832
ABSTRACT:
In a semiconductor device having a cobalt silicide film, at least nickel or iron is contained in the cobalt silicide film for preventing the rise of resistance incidental to thinning of the film.
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Ikeda Shuji
Iwasaki Tomio
Miura Hideo
Ohta Hiroyuki
Shimazu Hiromi
Antonelli, Terry Stout and Kraus, LLP.
Coleman W. David
Renesas Technology Corp.
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