4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Haruki Komano

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Charged beam apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused ion beam deposition using TMCTS

Fishing – trapping – and vermin destroying
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Mask defect repair system and method

Image analysis – Applications – Manufacturing or product inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Mask defect repair system and method which controls a dose of a

Image analysis – Applications – Manufacturing or product inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of depositing an insulating film and a focusing ion beam

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Haruki Komano does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Haruki Komano, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Haruki Komano will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-101390

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure