4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Haruhiko Yokoyama

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Appearance inspecting method

Image analysis – Histogram processing – For setting a threshold
Patent

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Appearance inspection method for electronic parts

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Dot pattern-examining apparatus

Boots – shoes – and leggings
Patent

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Flaw detection apparatus

Image analysis – Applications – Manufacturing or product inspection
Patent

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Flaw detection apparatus using digital image data indicative of

Image analysis – Applications – Manufacturing or product inspection
Patent

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Profile ID: LFUS-PAI-P-333860

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