Image analysis – Applications – Manufacturing or product inspection
Patent
1998-01-16
1998-12-15
Au, Amelia
Image analysis
Applications
Manufacturing or product inspection
348128, 356237, 382108, 382288, G06K 900
Patent
active
058504680
ABSTRACT:
A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as a group of plural pixels utilizing the image processing technique. An image processor is provided for detecting a direction in which each of group extends to combine a plurality of groups extending in substantially the same direction. The image processor further produces a flaw signal indicating sizes of thus combined groups.
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Kobayashi Akira
Yokoyama Haruhiko
Au Amelia
Matsushita Electric - Industrial Co., Ltd.
Patel Jayanti K.
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