Image analysis – Applications – Manufacturing or product inspection
Patent
1997-07-25
2000-03-14
Chang, Jon
Image analysis
Applications
Manufacturing or product inspection
348 92, 36446817, G06K 900
Patent
active
060383356
ABSTRACT:
A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as regions which are groups of plural pixels utilizing the image processing technique. An image processor is provided for detecting an extending direction in which each region extends based on a contour line of each region, so that regions extending in the same direction are clustered as one region. The image processor further produces a flaw signal indicating sizes of thus clustered regions.
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Kobayashi Akira
Yokoyama Haruhiko
Chang Jon
Matsushita Electric - Industrial Co., Ltd.
Patel Jayanti K.
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