Dot pattern-examining apparatus

Details Dot pattern-examining apparatus Dot pattern-examining apparatus

1994-05-25

1996-10-29

Trammell, James P.

Boots, shoes, and leggings

G06F 1700

Patent

active

055702988

ABSTRACT:
A dot pattern-examining apparatus examines a dot pattern displayed on a display screen by picking up a two-dimensional image of the display screen and by performing image processing with respect to the dot pattern on the two-dimensional image. An image projection data generating section generates image projection data indicative of a set of density values by accumulating, on a predetermined axis, density values of individual dots of the two-dimensional image of the display screen for each line. Then, a run-length data generating section generates run-length data indicative of a set of combinations of an accumulated density value and a length thereof, based on the image projection data of the two-dimensional image. Thereafter, a run-length data matching section compares the run-length data of the two-dimensional image with a reference run-length data indicating a reference dot pattern and generated in advance by the run-length data generating section, to thereby determine a position having run-length data which most match the reference run-length data as the position where the dot pattern to be examined exists.

REFERENCES:
patent: 4567610 (1986-01-01), McConnell
patent: 4823194 (1989-04-01), Mishima et al.
patent: 4912559 (1990-03-01), Ariyoshi et al.
patent: 4941192 (1990-07-01), Mishima et al.
patent: 5257116 (1993-10-01), Suzuki
patent: 5412578 (1995-05-01), Takagi et al.

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