4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Hai Quang Pham

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Accelerated single-ended sensing for a memory circuit

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Built-in redundancy architecture for computer memories

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Built-in redundancy architecture for computer memories

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Built-in self-test and self-repair methods and devices for...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Integrated circuit having a memory with...

Static information storage and retrieval – Read/write circuit – Complementing/balancing
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Profile ID: LFUS-PAI-P-1904893

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