4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Alignment marks

Gayle W. Miller, Jr.

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Electrostatic discharge (ESD) protection structure and a...

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays
Reexamination Certificate

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Electrostatic discharge (ESD) protection structure and a...

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate

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Method for forming a self-aligned twin well region with...

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Self-aligned
Reexamination Certificate

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Methods of forming reduced electric field DMOS using...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
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Registration mark within an overlap of dopant regions

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3093218

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