4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Fumihito Ohta

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Apparatus for analyzing a failure in a semiconductor wafer and m

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Failure analysis method that allows high-precision failure...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Failure analysis system, fatal failure extraction method and rec

Static information storage and retrieval – Read/write circuit – Testing
Patent

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System for analyzing a failure in a semiconductor wafer by calcu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Profile ID: LFUS-PAI-P-817086

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