4. Optics: measuring and testing
  5. By light interference
  6. For dimensional measurement

Frank E. Gennari

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Characterizing aberrations in an imaging lens and...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Design check database

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Fast pattern matching

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and system for performing pattern classification of...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of locating areas in an image such as a photo mask...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Frank E. Gennari does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Frank E. Gennari, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Frank E. Gennari will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2947784

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure