Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2008-09-30
2011-12-13
Lin, Sun (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S052000, C716S112000, C716S118000
Reexamination Certificate
active
08079005
ABSTRACT:
Disclosed is an approach for performing pattern classification for electronic designs. One advantage of this approach is that it can use fast pattern matching techniques to classify both patterns and markers based on geometric similarity. In this way, the large number of markers and hotspots that typically are identified within an electronic design can be subsumed and compressed into a much smaller set of pattern families. This significantly reduced the number of patterns that must be individually analyzed, which considerably reduces the quantity of system resources and time needed to analyze and verify a circuit design.
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Ma, N. et al, “Automatic hotspot classification using pattern-based clustering,” Design for Manufacturability through Design-Process Integration II, Proc. of SPIE vol. 6925, 692505, 2008.
Gennari Frank E.
Lai Weinong
Lai Ya-Chieh
Lei Junjiang
Moskewicz Matthew W
Cadence Design Systems Inc.
Lin Sun
Vista IP Law Group LLP
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