Method and system for performing pattern classification of...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing

Reexamination Certificate

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C716S052000, C716S112000, C716S118000

Reexamination Certificate

active

08079005

ABSTRACT:
Disclosed is an approach for performing pattern classification for electronic designs. One advantage of this approach is that it can use fast pattern matching techniques to classify both patterns and markers based on geometric similarity. In this way, the large number of markers and hotspots that typically are identified within an electronic design can be subsumed and compressed into a much smaller set of pattern families. This significantly reduced the number of patterns that must be individually analyzed, which considerably reduces the quantity of system resources and time needed to analyze and verify a circuit design.

REFERENCES:
patent: 7653892 (2010-01-01), Gennari et al.
patent: 7760347 (2010-07-01), Nehmadi et al.
patent: 7818707 (2010-10-01), Gennari et al.
patent: 7831942 (2010-11-01), Gennari et al.
patent: 2006/0269120 (2006-11-01), Nehmadi et al.
Ma, N. et al, “Automatic hotspot classification using pattern-based clustering,” Design for Manufacturability through Design-Process Integration II, Proc. of SPIE vol. 6925, 692505, 2008.

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