Design check database

Details Design check database Design check database

2006-12-12

2010-11-09

Whitmore, Stacy A (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C430S030000

Reexamination Certificate

active

07831942

ABSTRACT:
Systems and methods for creating and implementing two-dimensional (2D), image-based design rules (IBDRs) are disclosed. Techniques for creating 2D IBDR can include identifying a search pattern that is representative of a 2D pattern of interest of a design, creating a pattern representation based on the search pattern, defining an anchor point for the pattern representation, and assigning weights to elements of the pattern representation. The 2D IBDR can be used in systems and method for searching a design by comparing the 2D IBDR to the design. A number of 2D IBDRs can be merged into a subset of similar 2D IBDRs by characterizing desired rule geometries, sorting the 2D IBDRs into groups according to the desired rule geometries, merging the groups of 2D IBDRs into a single representative search pattern. Additionally, standard design rules can be created from the disclosed 2D IBDRs. The standard design rule can be created from a 2D pattern of interest by defining an origin of a shape within the 2D pattern of interest, identifying features within the 2D pattern of interest, deriving parameters relative to the origin for each of the identified features, and writing the standard design rule script using the derived parameters.

REFERENCES:
patent: 6044007 (2000-03-01), Capodieci
patent: 6057249 (2000-05-01), Chen
patent: 6171731 (2001-01-01), Medvedeva et al.
patent: 6393602 (2002-05-01), Atchison et al.
patent: 6397373 (2002-05-01), Tseng et al.
patent: 6425112 (2002-07-01), Bula et al.
patent: 6453457 (2002-09-01), Pierrat et al.
patent: 6492066 (2002-12-01), Capodieci et al.
patent: 6523162 (2003-02-01), Agrawal
patent: 6611946 (2003-08-01), Richardson et al.
patent: 7003758 (2006-02-01), Ye et al.
patent: 7175940 (2007-02-01), Laidig et al.
patent: 7243316 (2007-07-01), White et al.
patent: 7318214 (2008-01-01), Prasad et al.
patent: 7386433 (2008-06-01), MacLean et al.
patent: 2002/0083401 (2002-06-01), Breiner et al.
patent: 2003/0061592 (2003-03-01), Agrawal et al.
patent: 2003/0103189 (2003-06-01), Neureuther
patent: 2003/0118917 (2003-06-01), Zhang et al.
patent: 2003/0192013 (2003-10-01), Cote et al.
patent: 2004/0123265 (2004-06-01), Andreev et al.
patent: 2005/0015740 (2005-01-01), Sawicki et al.
patent: 2005/0076322 (2005-04-01), Ye et al.
patent: 2005/0100802 (2005-05-01), Callan et al.
patent: 2005/0114822 (2005-05-01), Axelrad et al.
patent: 2005/0130047 (2005-06-01), Kroyan
patent: 2006/0075379 (2006-04-01), Kamat
patent: 2006/0206851 (2006-09-01), Van Wingerden et al.
patent: 2007/0077504 (2007-04-01), Park
Notice of Allowance mailed Apr. 9, 2009 for U.S. Appl. No. 11/207,266.
Notice of Allowance mailed Dec. 22, 2008 for U.S. Appl. No. 11/207,266.
Non-Final OA mailed Apr. 25, 2008 for U.S. Appl. No. 11/207,266.
Non-Final OA mailed Nov. 30, 2007 for U.S. Appl. No. 11/207,266.
Notice of Allowance mailed May 29, 2009 for U.S. Appl. No. 11/609,903.
Non-Final OA mailed Nov. 5, 2008 for U.S. Appl. No. 11/609,903.
Final OA mailed Apr. 13, 2009 for U.S. Appl. No. 11/609,904.
Non-Final OA mailed Jul. 23, 2009 for U.S. Appl. No. 11/609,904.
Non-Final OA mailed Sep. 15, 2008 for U.S. Appl. No. 11/609,904.
Notice of Allowance dated Apr. 21, 2008 for U.S. Appl. No. 11/207,267.
Non-Final OA dated Nov. 30, 2007 for U.S. Appl. No. 11/207,267.
Final OA mailed Jul. 17, 2009 for U.S. Appl. No. 11/609,895.
Non-Final OA mailed Mar. 16, 2009 for U.S. Appl. No. 11/609,895.
Non-Final OA mailed Sep. 18, 2008 for U.S. Appl. No. 11/609,895.
Non-Final Office Action dated Feb. 19, 2001 for U.S. Appl. No. 11/609,901.

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