4. Semiconductor device manufacturing: process
  5. With measuring or testing

Eckhard Langer

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Interface void monitoring in a damascene process

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of testing an integrity of a material layer in a...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Semiconductor structure comprising a stress sensitive...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Technique for forming metal lines in a semiconductor by...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Technique for increasing adhesion of metallization layers by...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Eckhard Langer does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Eckhard Langer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Eckhard Langer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2710305

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure