Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-11-27
2007-11-27
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S726000
Reexamination Certificate
active
11213327
ABSTRACT:
Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, one or more signatures are received that indicate the presence of one or more errors in one or more corresponding compressed test responses. Scan cells in the circuit-under-test that caused the errors are identified by analyzing the signatures. In this exemplary embodiment, the analysis includes selecting a scan cell candidate that potentially caused an error in a compressed test response based at least partially on a weight value associated with the scan cell candidate, the weight value being indicative of the likelihood that the scan cell candidate caused the error. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided.
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Das et al.,
Mrugalski Grzegorz
Pogiel Artur
Rajski Janusz
Tyszer Jerzy
Wang Chen
Klarquist & Sparkman, LLP
Ton David
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