X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Examiner
active
No affiliations
Charge trapping correction in photon detector systems
Lithotripsy work station
Method and apparatus for texture analysis
Method and device for tightness control of a joint
Normal incidence X-ray mirror for chemical microanalysis
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Profile ID: LFUS-PAI-P-338086