Method and apparatus for texture analysis

Details Method and apparatus for texture analysis Method and apparatus for texture analysis

1989-07-27

1991-01-01

Fields, Carolyn E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 72, 378207, G01N 2320

Patent

active

049824171

ABSTRACT:
In analyzing the texture of rolled metal sheets and strips by means of X-rays or .gamma.-rays that penetrate them, the total beam emitted by the source of radiation is divided by collimators into several component beams, and each component beam is aimed at a different angle at a component area of the sheet or strip being tested. The diffracted radiation that penetrates the sheet is analyzed in accordance with its energy distribution in detectors and the results are processed in a computer.

REFERENCES:
patent: 3319065 (1967-05-01), Webster et al.
patent: 3596092 (1971-07-01), Marjorum
patent: 3984679 (1976-10-01), Lublin et al.
patent: 4095103 (1978-06-01), Cohen et al.
patent: 4125771 (1978-11-01), Erwin
patent: 4633420 (1986-12-01), Masanobu
patent: 4649556 (1987-03-01), Rinik et al.
patent: 4715053 (1987-12-01), Comstock et al.

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