X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1989-05-12
1990-02-27
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, 250563, 2503601, G01B 1506
Patent
active
049052632
ABSTRACT:
A method and a device for inspecting a joint such as the joint at the rim of a container. Radiant energy is directed into a small area of irradiation on the joint and the container rim is moved relative to the radiant energy so that the area of irradiation moves in one direction along the rim. Additionally, the area of irradiation is scanned crosswise to the one direction to move the area of irradiation across the width of the joint. Radiant energy reflected from the area of irradiation is detected. This radiant energy indicates the characteristics of the joint. The characteristics indicated by the radiant energy are compared to predetermined set value characteristics to detect product residue or other defects in the joint.
REFERENCES:
patent: 3819943 (1974-06-01), Ishibashi et al.
patent: 3880750 (1975-04-01), Butler et al.
patent: 4086497 (1978-04-01), Murray
patent: 4538290 (1985-08-01), Nakamura
patent: 4694479 (1987-09-01), Bacskai et al.
patent: 4794264 (1988-12-01), Quackenbos et al.
Lampi et al., Automatic Infrared Radiometric Scanning to Detect Flexible Packaging Seal Defects, IEEE Transactions on Industrial Electronics and Control Instrumentation, vol. IECI-20, No. 4, Nov., 1973, pp. 205-212.
Larsson Lennart
Ohlsson H.ang.kan
Ullman Bo
AB Akerlund & Rausing
Fields Carolyn E.
Porte David P.
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