4. Excavating

David E. Lackey

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Apparatus for assisting backside focused ion beam device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Arrangement for testing semiconductor chips while...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Avoiding race conditions at clock domain crossings in an...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Concurrent logical and physical construction of voltage...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Double-edge-triggered flip-flop providing two data...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
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Profile ID: LFUS-PAI-P-277512

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