4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Chwen-Ming Liu

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Abatement of electron beam charging distortion during dimensiona

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Abatement of electron beam charging distortion during dimensiona

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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ARC layer enhancement for reducing metal loss during via etch

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Patent

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Effective load length increase by topography

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Integrated defect yield management and query system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-42957

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