4. Optical: systems and elements
  5. Light interference
  6. Produced by coating or lamina

Ching-Hung Kao

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Circuit to characterize matching of energy-storage components

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Reexamination Certificate

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CMOS image sensor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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CMOS image sensor and an additional N-well for connecting a...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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CMOS image sensor structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Color filter structure having inorganic layers

Optical: systems and elements – Light interference – Produced by coating or lamina
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2238832

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