4. Active solid-state devices (e.g., transistors, solid-state diode
  5. With means to control surface effects
  6. Insulating coating

Cheng-Hung Chang

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Decreasing metal-silicide oxidation during wafer queue time

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Germanium FinFETs having dielectric punch-through stoppers

Semiconductor device manufacturing: process – Making regenerative-type switching device – Having field effect structure
Reexamination Certificate

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High performance strained channel MOSFETs by coupled stress...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Hybrid metal fully silicided (FUSI) gate

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Hybrid metal fully silicided (FUSI) gate

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2156758

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