4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Chang Yeol Lee

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DC stress supply circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Input and output driver

Electronic digital logic circuitry – Interface – Current driving
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Method for fabricating dual-gate semiconductor device

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
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Method for reducing poly-depletion due to thickness...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Method for reducing poly-depletion in dual gate CMOS...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Profile ID: LFUS-PAI-P-2626232

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