Chang-Sub Lee

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Apparatus for testing reliability of interconnection in...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus for testing reliability of interconnection in...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Apparatus for testing reliability of interconnection in...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Buried channel type transistor having a trench gate and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Data transmission/reception device using an...

Facsimile and static presentation processing – Static presentation processing – Emulation or plural modes
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Profile ID: LFUS-PAI-P-1662782

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