4. Metal working
  5. Barrier layer or semiconductor device making

Bryan D. Schmidt

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Electrostatic apparatus and method for removing particles from s

Metal working – Barrier layer or semiconductor device making
Patent

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Method and apparatus for removing particles from semiconductor w

Metal working – Barrier layer or semiconductor device making
Patent

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Method and apparatus for thermally insulating a wafer support

Heat exchange – With retainer for removable article – Electrical component
Patent

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Semiconductor wafer defect monitoring

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
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Profile ID: LFUS-PAI-P-970178

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