Electrostatic apparatus and method for removing particles from s

Metal working – Barrier layer or semiconductor device making

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437210, 437925, 15 151, H01L 2130

Patent

active

053504283

ABSTRACT:
Disclosed herein is an apparatus and method for cleaning the edges of semiconductor wafers by using a particle removing means having an electrostatically charged material. The particles are collected and disposed of so that they do not come in contact again with the clean semiconductor wafers.

REFERENCES:
patent: 2920987 (1960-01-01), Landry et al.
patent: 3668008 (1972-06-01), Sevfurynse
patent: 3939526 (1976-02-01), Mania et al.
patent: 4268934 (1981-05-01), Testone
patent: 4483611 (1984-11-01), Matsuura et al.
patent: 4677704 (1987-07-01), Huggins
patent: 4744833 (1988-05-01), Cooper et al.
patent: 4777804 (1988-10-01), Bowling et al.
patent: 4785324 (1988-11-01), Yamazaki et al.
patent: 4839206 (1989-06-01), Waldenberger
patent: 4864461 (1989-09-01), Kasahara
patent: 4987286 (1991-01-01), Allen
"IBM TDB" vol. 18, No. 5, Oct. 1975, K. S. Sachar.

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