4. Thermal measuring and testing
  5. Temperature measurement
  6. In spaced noncontact relationship to specimen

Bruce E. Adams

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Absorber layer candidates and techniques for application

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Compensation techniques for substrate heating processes

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Compensation techniques for substrate heating processes

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Radiation or energy treatment modifying properties of...
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Dynamic surface annealing using addressable laser array with...

Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of cure or hardenability
Reexamination Certificate

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Heat resistant curable surface coating composition comprising th

Stock material or miscellaneous articles – Composite – Of addition polymer from unsaturated monomers
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Profile ID: LFUS-PAI-P-11283

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