4. Static information storage and retrieval
  5. Systems using particular element
  6. Amorphous

Bernhard Ruf

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Device and method for electrical contacting semiconductor...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Integrated circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Integrated circuit including a memory element programmed...

Static information storage and retrieval – Systems using particular element – Amorphous
Reexamination Certificate

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Integrated circuit including memory element with spatially...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Integrated circuit, test structure and method for testing...

Static information storage and retrieval – Read/write circuit – Testing
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Profile ID: LFUS-PAI-P-2233959

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