Device and method for electrical contacting semiconductor...

Details Device and method for electrical contacting semiconductor... Device and method for electrical contacting semiconductor...

2008-03-18

2010-12-14

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

07852095

ABSTRACT:
A device and method are disclosed for electrical contacting of semiconductor devices for testing. One embodiment provides for testing semiconductor devices or integrated circuits, including a probe card with contact tips for the electrical contacting of the semiconductor devices. The electrical connection of at least one contact tip to the test system is adapted to be switched via a resistively switching memory cell. A resistively switching memory cell in the form of a nano switch is integrated in the electrical connection of the contact tip.

REFERENCES:
patent: 7598021 (2009-10-01), Sandhu
patent: 2009/0161460 (2009-06-01), Symanczyk et al.
patent: 1653473 (2006-05-01), None

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