4. Excavating

Bernd K. F. Koenemann

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Arrangement for testing semiconductor chips while...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Clocking mechanism for delay, short path and stuck-at testing

Excavating
Patent

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Hybrid pattern self-testing of integrated circuits

Excavating
Patent

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Method and apparatus for memory dynamic burn-in and test

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Profile ID: LFUS-PAI-P-776003

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